Analysing inspection frequency for wafer bumping process and an empirical study of UNISON decision framework
Year of publication: |
2008
|
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Authors: | Chien, Chen-Fu ; Hu, Chih-Han ; Lin, Chi-Yung |
Published in: |
International journal of manufacturing technology and management. - Milton Keynes [u.a.] : Inderscience Enterprises, ISSN 1368-2148, ZDB-ID 2037402-1. - Vol. 14.2008, 1/2, p. 130-144
|
Subject: | Halbleiterindustrie | Semiconductor industry | Automatisierte Produktion | Automated manufacturing | Qualitätsmanagement | Quality management | Entscheidung | Decision | Risiko | Risk |
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