Anisotropic percolation and the d-dimensional surface roughening problem
We review recent numerical simulations of several models of interface growth in d-dimensional media with quenched disorder. These models belong to the universality class of anisotropic diode-resistor percolation networks. The values of the roughness exponent δ=0.63±0.01 (d=1+1) and δ=0.48±0.02 (d=2+1) are in good agreement with our recent experiments. The values of δ in higher dimensions (δ=0.38±0.03 in d=4 and δ=0.27±0.05 in d=5) do not support a recent theoretical conjecture.
Year of publication: |
1993
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Authors: | Buldyrev, Sergey V. ; Havlin, Shlomo ; Stanley, H. Eugene |
Published in: |
Physica A: Statistical Mechanics and its Applications. - Elsevier, ISSN 0378-4371. - Vol. 200.1993, 1, p. 200-211
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Publisher: |
Elsevier |
Saved in:
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