Approximations for Expected Generation Number
Year of publication: |
2007
|
---|---|
Authors: | Cole, D. J. ; Ridout, M. S. ; Morgan, B. J. T. ; Byrne, L. J. ; Tuite, M. F. |
Published in: |
Biometrics. - The International Biometric Society. - Vol. 63.2007, 4, p. 1023-1030
|
Publisher: |
The International Biometric Society |
Saved in:
Online Resource
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