Design of EWMA and CUSUM control charts subject to random shift sizes and quality impacts
Year of publication: |
2007
|
---|---|
Authors: | Chen, Argon ; Chen, Y.K. |
Published in: |
IIE transactions / Institute of Industrial Engineers, Norcross, Ga : industrial engineering and development. - Philadelphia, Pa : Taylor & Francis, ISSN 0569-5554, ZDB-ID 2460191. - Vol. 39.2007, 12, p. 1127
|
Saved in:
Saved in favorites
Similar items by person
-
Computational and experimental investigations of an omni-flow wind turbine
Ying, P., (2015)
-
Editorial: Applications of quantitative methods in semiconductor manufacturing
Mönch, Lars, (2015)
-
Chen, Argon, (2010)
- More ...