Fuzzy neural network based yield prediction model for semiconductor manufacturing system
Year of publication: |
2010
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Authors: | Wu, Lihui ; Zhang, Jie |
Published in: |
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 1604776. - Vol. 48.2010, 11, p. 3225-3244
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