Hot-carrier Reliability Lifetimes as Predicted by Berkeley's Model
Year of publication: |
1995
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Authors: | Meehan, A. ; O'Sullivan, P. ; Hurley, P. ; Mathewson, A. |
Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 11.1995, 4, p. 269-272
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