Improvement Detection by Control Charts for High Yield Processes
Year of publication: |
1993
|
---|---|
Authors: | Xie, M. ; Goh, T.N. |
Published in: |
International Journal of Quality & Reliability Management. - Emerald Group Publishing Limited, ISSN 1758-6682, ZDB-ID 1466792-7. - Vol. 10.1993, 7
|
Publisher: |
Emerald Group Publishing Limited |
Subject: | PROBABILITY | QUALITY | STATISTICAL PROCESS CONTROL | ZERO DEFECTS |
Saved in:
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