Knowledge generation and diffusion in science & technology : an empirical study of SiC-MOSFET based on scientific papers and patents
Year of publication: |
2024
|
---|---|
Authors: | Pan, Weiwei ; Jian, Lirong ; Liu, Tao |
Published in: |
Technology analysis & strategic management. - London : Taylor & Francis Group, ISSN 1465-3990, ZDB-ID 1485021-7. - Vol. 36.2024, 7, p. 1587-1603
|
Subject: | Bibliometrics | global main path analysis | knowledge diffusion | SiC-MOSFET | Bibliometrie | Wissenstransfer | Knowledge transfer | Innovationsdiffusion | Innovation diffusion | Patent | Welt | World | Technischer Fortschritt | Technological change | Wissensmanagement | Knowledge management |
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