Liquid crystal display surface uniformity defect inspection using analysis of variance and exponentially weighted moving average techniques
Year of publication: |
2005
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Authors: | Jiang, B.C. ; Wang, C.-C. ; Liu, H.-C. |
Published in: |
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 1604776. - Vol. 43.2005, 1, p. 67-80
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