Measuring the intensity of knowledge flow with patent statistics
Year of publication: |
2002
|
---|---|
Authors: | Fung, Michael K. ; Chow, William W. |
Published in: |
Economics Letters. - Elsevier, ISSN 0165-1765. - Vol. 74.2002, 3, p. 353-358
|
Publisher: |
Elsevier |
Saved in:
Online Resource
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