Nonparametric Approach to Patent Citations

The present article reexamines some of the issues regarding the benchmarking of patents using the NBER data base on U.S. patents by generalizing a parametric citation model and by estimating it using Generalized Additive Models (GAM) methodology. The main conclusion is that the estimated effects differ considerably from sector to sector, and the differences can be estimated nonparametrically but not by the parametric dummy variable approach.

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Year of publication:	2009
Authors:	Mariel, Petr ; Orbe, Susan
Published in:	Prague Economic Papers. - Vysoká Škola Ekonomická v Praze, ISSN 1210-0455. - Vol. 2009.2009, 3, p. 251-266
Publisher:	Vysoká Škola Ekonomická v Praze
Subject:	GAM \| patent benchmarking \| USPTO

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Extent:	text/html
Type of publication:	Article
Language:	English
Classification:	C14 - Semiparametric and Nonparametric Methods ; O3 - Technological Change; Research and Development
Source:	RePEc - Research Papers in Economics

Persistent link: https://www.econbiz.de/10008548656