Optimal critical values of pre-tests when estimating the regression error variance : analytical findings under a general loss structure
Alan T. K. Wan; Guohua Zou
| Year of publication: |
2003
|
|---|---|
| Authors: | Wan, Alan T. K. ; Zou, Guohua |
| Published in: |
Journal of econometrics. - Amsterdam [u.a.] : Elsevier, ISSN 0304-4076, ZDB-ID 184861-6. - Vol. 114.2003, 1, p. 165-196
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| Subject: | Theorie | Theory | Multiple Regression | Multiple regression |
| Extent: | graph. Darst |
|---|---|
| Type of publication: | Article |
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10001738931