Patent examination at the State Intellectual Property Office in China
Year of publication: |
2011
|
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Authors: | Liegsalz, Johannes ; Wagner, Stefan |
Publisher: |
Berlin : European School of Management and Technology (ESMT) |
Subject: | Patent | Immaterialgüterrechte | China | patent system | patent examination | State Intellectual Property Office China | duration analysis |
Series: | ESMT Working Paper ; 11-06 |
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Type of publication: | Book / Working Paper |
Type of publication (narrower categories): | Working Paper |
Language: | English |
Other identifiers: | 66556077X [GVK] hdl:10419/96565 [Handle] RePEc:esm:wpaper:ESMT-11-06 [RePEc] |
Source: |
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Patent examination at the State Intellectual Property Office in China
Liegsalz, Johannes, (2011)
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Patent examination at the State Intellectual Property Office in China
Liegsalz, Johannes, (2011)
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