PHASE TRANSFORMATION AND R–T CHARACTERISTICS OF VACUUM ANNEALED VANADIUM OXIDE THIN FILMS
Year of publication: |
2008
|
---|---|
Authors: | WANG, Y. L. ; LI, M. C. ; ZHAO, L. C. |
Published in: |
Surface Review and Letters (SRL). - World Scientific Publishing Co. Pte. Ltd., ISSN 1793-6667. - Vol. 15.2008, 01, p. 59-64
|
Publisher: |
World Scientific Publishing Co. Pte. Ltd. |
Subject: | Vanadium oxide | phase | vacuum annealing | temperature coefficient of resistance (TCR) |
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