Predicting Gate Oxide Reliability from Statistical Process Control Nodes in Integrated Circuit Manufacturing -- A Case Study
Year of publication: |
1997
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Authors: | Prendergast, J.G. ; Murphy, E. ; Stephenson, M. |
Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 13.1997, 5, p. 269-278
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Saved in:
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