Reliability Test Plans for Exponentiated Log-Logistic Distribution
A generalization of the log-logistic distribution called exponentiated log-logistic distribution (in lines of exponentiated Weibull distribution suggested by Mudholkar and Srivastava [Technometrics 37: 436-445, 1995]) is considered. In this paper the operating characteristic for a sampling plan is determined for the case that a lot of products is submitted for inspection with lifetimes specified by an exponentiated log-logistic distribution (ELLD). The results are illustrated by a numerical example.
Year of publication: |
2006
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Authors: | Rosaiah K. ; Kantam R. R. L. ; Santosh, Kumar |
Published in: |
Economic Quality Control. - De Gruyter. - Vol. 21.2006, 2, p. 279-289
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Publisher: |
De Gruyter |
Saved in:
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