The worst-practice DEA model with slack-based measurement
Year of publication: |
2009
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Authors: | Liu, Fuh-hwa Franklin ; Chen, Cheng-Li |
Published in: |
Computers & industrial engineering : CAIE ; an internat. journal. - Amsterdam [u.a.] : Elsevier, ISSN 0360-8352, ZDB-ID 1969936. - Vol. 57.2009, 2, p. 496-506
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