Towards a theory of confidence intervals for system reliability
Consider a binary coherent system of nonrepairable components, the lifelength distributions of which lie in the single parameter exponential family of distributions. Given observations of the lifelengths of the constituent components, it is shown how inversion of the likelihood ratio test can be used to calculate strongly consistent approximate confidence intervals for the survivor function of the system lifelength and for the mean time to system failure.
Year of publication: |
1993
|
---|---|
Authors: | Baxter, Laurence A. |
Published in: |
Statistics & Probability Letters. - Elsevier, ISSN 0167-7152. - Vol. 16.1993, 1, p. 29-38
|
Publisher: |
Elsevier |
Keywords: | Binary coherent structure function reliability function likelihood ratio test exponential family of distributions sufficient statistic confidence interval chi-square distribution mean time to failure |
Saved in:
Online Resource
Saved in favorites
Similar items by person
-
The moments of the forward recurrence times of an alternating renewal process
Baxter, Laurence A., (1983)
-
Lifelength in a random environment
Baxter, Laurence A., (1994)
-
A note on the stability of the estimation of the exponential distribution
Baxter, Laurence A., (1990)
- More ...