Wafer Defect Inspection Optimization : Models, Analysis and Algorithms
Year of publication: |
2019
|
---|---|
Authors: | Shi, Zhongshun ; Qin, Ming ; Chen, Weiwei ; Gao, Siyang ; Shi, Leyuan |
Publisher: |
[S.l.] : SSRN |
Subject: | Mathematische Optimierung | Mathematical programming | Algorithmus | Algorithm | Theorie | Theory |
Extent: | 1 Online-Ressource (37 p) |
---|---|
Type of publication: | Book / Working Paper |
Language: | English |
Notes: | Nach Informationen von SSRN wurde die ursprüngliche Fassung des Dokuments April 6, 2019 erstellt |
Other identifiers: | 10.2139/ssrn.3371939 [DOI] |
Classification: | C6 - Mathematical Methods and Programming |
Source: | ECONIS - Online Catalogue of the ZBW |
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