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isPartOf:"Les cahiers de recherche / HEC Paris"
~isPartOf:"Applied economics letters"
~person:"Barnum, Darold"
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Technical efficiency bias caused by intra-input aggregation in data envelopment analysis
Barnum, Darold
;
Gleason, John M.
- In:
Applied economics letters
12
(
2005
)
13
,
pp. 785-788
Persistent link: https://www.econbiz.de/10003196182
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