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subject:"Patent"
~person:"Sampat, Bhaven N."
~subject:"Universität"
~type_genre:"Aufsatz im Buch"
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Intellectual property rights : legal and economic challenges for development
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Is Bayh-Dole good for developing countries? : lessons from the US experience
So, Anthony D.
;
Sampat, Bhaven N.
;
Rai, Arti K.
; …
- In:
Intellectual property rights : legal and economic …
,
(pp. 201-215)
.
2014
Persistent link: https://www.econbiz.de/10010354867
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