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subject:"Prognoseverfahren"
~person:"Lee, Yoon-jin"
~subject:"Panel"
~type_genre:"Thesis"
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Search: subject_exact:"Nichtlineares Verfahren"
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Lee, Yoon-jin
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Generalized spectral-based specification testing for time series and dynamic panel data model
Lee, Yoon-jin
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2006
Persistent link: https://www.econbiz.de/10003965661
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