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subject:"Risikomaß"
type_genre:"Elektronischer Datenträger als Beilage"
~institution:"Federal Reserve Bank of San Francisco"
~subject:"Bankrisiko"
~type_genre:"Working Paper"
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Elektronischer Datenträger als Beilage
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Federal Reserve Bank of San Francisco
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Sonderforschungsbereich Statistical Modelling of Nonlinear Dynamic Processes
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Testing the strong-form of market discipline : the effects of public market signals on bank risk
Kwan, Simon H.
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2004
Persistent link: https://www.econbiz.de/10002705370
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