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subject:"Technologiepolitik"
subject:"USA"
~isPartOf:"Journal of international economics"
~person:"Jensen, J. Bradford"
~person:"Pisano, Gary P."
~subject:"China"
~subject:"United States"
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Survival of the best fit: exposure to low-wage countries and the (uneven) growth of US manufacturing plants
Bernard, Andrew B.
;
Jensen, J. Bradford
;
Schott, Peter K.
- In:
Journal of international economics
68
(
2006
)
1
,
pp. 219-237
Persistent link: https://www.econbiz.de/10003232040
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