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type:"article"
~person:"Duan, Bin"
~person:"Kim, Byunghoon"
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International journal of information systems and supply chain management : JISSCM ; an official publication of the Information Resources Management Association
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International journal of production research
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A generalised uncertain decision tree for defect classification of multiple wafer maps
Kim, Byunghoon
;
Jeong, Young-Seon
;
Tong, Seung Hoon
; …
- In:
International journal of production research
58
(
2020
)
9
,
pp. 2805-2821
Persistent link: https://www.econbiz.de/10012265272
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2
Research on the production scheduling method of a semiconductor packaging test based with the clustering method
Han, Zhonghua
;
Zhang, Quan
;
Jiang, Yongqing
;
Duan, Bin
- In:
International journal of information systems and supply …
12
(
2019
)
2
,
pp. 36-56
Persistent link: https://www.econbiz.de/10012017797
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