Park, Sang-Jun; Yum, Bong-Jin - In: Journal of Applied Statistics 25 (1998) 1, pp. 41-62
Most of the previous work on optimal design of accelerated life test (ALT) plans has assumed instantaneous changes in stress levels, which may not be possible or desirable in practice, because of the limited capability of test equipment, possible stress shocks or the presence of undesirable...