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~isPartOf:"IEEE transactions on reliability : R ; IEEE T R"
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Software Reliability - Modeling and Analysis of Correlated Software Failures of Multiple Types
Dai, Y.-S.
;
Xie, M.
;
Poh, K.-L.
- In:
IEEE transactions on reliability : R ; IEEE T R
54
(
2005
)
1
,
pp. 100-106
Persistent link: https://www.econbiz.de/10006607708
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