//--> //--> //-->
Toggle navigation
Logout
Change account settings
EN
DE
ES
FR
A-Z
Beta
About EconBiz
News
Thesaurus (STW)
Research Skills
Help
EN
DE
ES
FR
My account
Logout
Change account settings
Login
Publications
Events
Your search terms
Search
Retain my current filters
~isPartOf:"International journal of production research"
~isPartOf:"Journal of the Operational Research Society"
~person:"Bae, Suk Joo"
Search options
All Fields
Title
Exact title
Subject
Author
Institution
ISBN/ISSN
Published in...
Publisher
Open Access only
Advanced
Search history
My EconBiz
Favorites
Loans
Reservations
Fines
You are here:
Home
Search: subject_exact:"Revenue-Management"
Narrow search
Delete all filters
| 3 applied filters
Year of publication
From:
To:
Subject
All
Algorithm
1
Algorithmus
1
Halbleiter
1
Halbleiterindustrie
1
Mustererkennung
1
Neural networks
1
Neuronale Netze
1
Pattern recognition
1
Revenue management
1
Revenue-Management
1
Semiconductor
1
Semiconductor industry
1
neural network
1
pattern recognition
1
similarity
1
spatial defects
1
wafer map
1
yield management
1
more ...
less ...
Type of publication
All
Article
1
Type of publication (narrower categories)
All
Article in journal
1
Aufsatz in Zeitschrift
1
Language
All
English
1
Author
All
Bae, Suk Joo
Ai, Xingzheng
1
Ashley, Allan
1
Avinadav, Tal
1
Bart, Nelly
1
Cao, Erbao
1
Chen, Gang
1
Chen, Jing
1
Chen, Jingxian
1
Chen, Lijian
1
Chen, Yu-Hung
1
Cheng, Ya Ching
1
Chernonog, Tatyana
1
Chevalier, Philippe B.
1
Choi, Gyunghyun
1
Choi, Tsan-Ming
1
Chu, Chengbin
1
Dong, Ming
1
Fan, Zhi-Ping
1
Feng, Xue-hao
1
Fu, Yufang
1
Geng, Na
1
Gong, Yeming
1
Goswami, Adrijit
1
Guo, Xiaolong
1
Ha, Chunghun
1
Han, Guanghua
1
He, Wen
1
Herbon, Avi
1
Hou, Yumei
1
Houcai Shen
1
Huang, George Q.
1
Huang, Zhimin
1
Hui, Yer Van
1
Hung, Hui Nien
1
Hung, Yu-feng
1
Ji, Ting
1
Jiang, Zhibin
1
Kim, Kyoung-Kuk
1
Kim, Sung-hee
1
more ...
less ...
Published in...
All
International journal of production research
Journal of the Operational Research Society
Source
All
ECONIS (ZBW)
1
Showing
1
-
1
of
1
Sort
relevance
articles prioritized
date (newest first)
date (oldest first)
1
Multi-step ART1 algorithm for recognition of defect patterns on semiconductor wafers
Choi, Gyunghyun
;
Kim, Sung-hee
;
Ha, Chunghun
;
Bae, Suk Joo
- In:
International journal of production research
50
(
2012
)
12
,
pp. 3274-3287
Persistent link: https://www.econbiz.de/10009576046
Saved in:
Results per page
10
25
50
100
250
A service of the
zbw
×
Loading...
//-->