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Dependent SiZer: Goodness-of-Fit Tests for Time Series Models
Park, Cheolwoo
;
Marron, J. S.
;
Rondonotti, Vitaliana
- In:
Journal of Applied Statistics
31
(
2004
)
8
,
pp. 999-1017
burstiness than is predicted by the popular, long- range dependent,
Fractional
Gaussian
Noise
model. …
Persistent link: https://www.econbiz.de/10005639670
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