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~isPartOf:"Journal of applied econometrics"
~person:"Kandel, Shmuel"
~person:"Leybourne, Stephen James"
~type:"article"
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More powerpul panel data unit root tests with an application to mean reversion in real exchange rates
Smith, L. Vanessa
;
Leybourne, Stephen James
;
Kim, Tae-hwan
- In:
Journal of applied econometrics
19
(
2004
)
2
,
pp. 147-170
Persistent link: https://www.econbiz.de/10002010349
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