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~isPartOf:"NBER working paper series"
~person:"Benner, Mary"
~subject:"Industrieforschung"
~subject:"Learning organization"
~subject:"USA"
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Close to You? Bias and Precision in Patent-Based Measures of Technological Proximity
Benner, Mary
-
2007
the proximities among firms in
knowledge
space. Researchers could measure proximity among firms with a variety of measures …
Persistent link: https://www.econbiz.de/10012465328
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