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~isPartOf:"Technology analysis & strategic management"
~person:"Kim, Juram"
~subject:"Bibliometrics"
~subject:"Cluster analysis"
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Patterns of technology life cycles : stochastic analysis based on patent citations
Lee, Changyong
;
Kim, Juram
;
Noh, Meansun
;
Woo, Han-Gyun
; …
- In:
Technology analysis & strategic management
29
(
2017
)
1
,
pp. 53-67
Persistent link: https://www.econbiz.de/10011710066
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