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~isPartOf:"The European Physical Journal B - Condensed Matter and Complex Systems"
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61.05.C- X-ray diffraction and scattering
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61.82.Rx Nanocrystalline materials
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Full X-ray pattern analysis of vacuum deposited pentacene thin films
Werzer, O.
;
Stadlober, B.
;
Haase, A.
;
Oehzelt, M.
;
Resel, R.
- In:
The European Physical Journal B - Condensed Matter and …
66
(
2008
)
4
,
pp. 455-459
Persistent link: https://www.econbiz.de/10009281523
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