Soliman, H.S.; Abdel Hady, D.A.; Abdel Rahman, K.F.; … - In: Physica A: Statistical Mechanics and its Applications 216 (1995) 1, pp. 77-84
SnSe thin films of different thicknesses were prepared by the thermal evaporation technique in vacuum of 10−4 Pa. The structure analysis of the films as determined from the electron diffraction pattern and X-ray diffraction indicate that the films were polycrystalline of orthorhombic...