Pennetta, C; Alfinito, E; Reggiani, L; Ruffo, S - In: Physica A: Statistical Mechanics and its Applications 340 (2004) 1, pp. 380-387
The distribution of resistance fluctuations of conducting thin films with granular structure near electrical breakdown is studied by numerical simulations. The film is modeled as a resistor network in a steady state determined by the competition between two biased processes, breaking and...