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Kittler, Markus G.
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Divide and conquer : relating patent quality and value in a conceptual framework based on a systematic review
Ananthraman, Srinivasan
;
Cambré, Bart
;
Kittler, Markus G.
- In:
International journal of management reviews
26
(
2024
)
2
,
pp. 285-311
Persistent link: https://www.econbiz.de/10014532120
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