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~person:"Balakrishnan, N."
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Balakrishnan, N.
Kannan, N.
10
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3
Kannan, V.
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Kannan N.
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Kannan, N. G.
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Kannan, N.G.
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IEEE transactions on reliability : R ; IEEE T R
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OLC EcoSci
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Estimation - Goodness-of-Fit Tests Based on Spacings for Progressively Type-II Censored Data From a General Location-Scale Distribution
Balakrishnan, N.
;
Ng, H.K.T.
;
Kannan, N.
- In:
IEEE transactions on reliability : R ; IEEE T R
53
(
2004
)
3
,
pp. 349-356
Persistent link: https://www.econbiz.de/10006609048
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2
Point and Interval Estimation for Gaussian Distribution, Based on Progressively Type-II Censored Samples
Balakrishnan, N.
;
Kannan, N.
;
Lin, C.T.
;
Ng, H.K.T.
- In:
IEEE transactions on reliability : R ; IEEE T R
52
(
2003
)
1
,
pp. 90-95
Persistent link: https://www.econbiz.de/10006614195
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