OLIVA, A. I.; MALDONADO, R. D.; CEH, O.; CORONA, J. E.; … - In: Surface Review and Letters (SRL) 12 (2005) 02, pp. 289-298
We present an improved dynamical thermal model and the corresponding experimental efforts to determine thermal profiles of thin metallic films deposited on thick substrates (bimaterial system) as are usually used in microelectronics. A dynamical thermal model to characterize the Joule heating of...