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~person:"Dolino, G."
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68.55.-a Thin film structure and morphology
1
68.55.Ac Nucleation and growth: microscopic aspects
1
81.07.-b Nanoscale materials and structures: fabrication and characterization
1
PACS. 61.10.-i X-ray diffraction and scattering - 61.43.Gt Powders
1
PACS. 61.10.Eq X-ray scattering (including small-angle scattering)
1
porous materials - 64.70.Dv Solid-liquid transitions
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Dolino, G.
SHUTTLEWORTH, I. G.
8
Amo, Yuko
3
Barois, P.
3
Brückel, Th.
3
Cattapan, G.
3
Egidi, N.
3
Hennion, B.
3
Kremer, Gilberto M.
3
Lotti, P.
3
Maponi, P.
3
Marques, Wilson
3
Migliardo, P.
3
Petry, W.
3
Prandl, W.
3
Tominaga, Yasunori
3
Alves, Giselle M.
2
Bach, H.
2
Ban, S. L.
2
Benguigui, L.
2
Boué, F.
2
Chen, S.H.
2
Coddens, G.
2
Crupi, V.
2
Dorner, B.
2
Durchschlag, Helmut
2
Freyn, A.
2
Grosdidier, Y.
2
Gündüz, Güngör
2
Hagdorn, K.
2
Heidelbach, F.
2
Hohlwein, D.
2
Híjar, H.
2
Ihringer, J.
2
Klymenko, Yu. O.
2
Knorr, K.
2
Krupa, Tadeusz
2
Kästner, J.
2
Laan, G. van der
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The European Physical Journal B - Condensed Matter and Complex Systems
2
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Formation of porous silicon: an in situ investigation with high-resolution X-ray diffraction
Chamard, V.
;
Pichat, C.
;
Dolino, G.
- In:
The European Physical Journal B - Condensed Matter and …
21
(
2001
)
2
,
pp. 185-190
Persistent link: https://www.econbiz.de/10010556967
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2
In situ X-ray diffraction investigation of porous silicon strains induced by the freezing of a confined organic fluid
Faivre, C.
;
Bellet, D.
;
Dolino, G.
- In:
The European Physical Journal B - Condensed Matter and …
16
(
2000
)
3
,
pp. 447-454
Persistent link: https://www.econbiz.de/10009325055
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