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Search: subject:"TECHNICAL STANDARDS"
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Driesse, Menno
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Overcoming inefficiencies in patent licensing : a method to assess patent essentiality for
technical
standards
Bekkers, Rudi
;
Tur, Elena M.
;
Henkel, Joachim
;
Vorst, …
- In:
Research policy : policy, management and economic …
51
(
2022
)
10
,
pp. 1-13
Persistent link: https://www.econbiz.de/10013555003
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