Florindo, João B.; Sikora, Mariana S.; Pereira, Ernesto C. - In: Physica A: Statistical Mechanics and its Applications 392 (2013) 7, pp. 1694-1701
This work presents a methodology to the morphology analysis and characterization of nanostructured material images acquired from FEG-SEM (Field Emission Gun-Scanning Electron Microscopy) technique. The metrics were extracted from the image texture (mathematical surface) by the volumetric fractal...