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~person:"Higham, Kyle W."
~source:"econis"
~type_genre:"Arbeitspapier"
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Higham, Kyle W.
De Rassenfosse, Gaétan
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Patent quality : towards a systematic framework for analysis and measurement
Higham, Kyle W.
;
De Rassenfosse, Gaétan
;
Jaffe, Adam B.
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2020
Persistent link: https://www.econbiz.de/10012304046
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