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Hozak, Kurt
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Development of the yield-based
process
capability
index
, Cpy, to flexibly and accurately measure conformance
Kenyon, George N.
;
Sale, R. Samual
;
Hozak, Kurt
;
Chiou, Paul
- In:
International journal of quality & reliability management
33
(
2016
)
7
,
pp. 882-899
Persistent link: https://www.econbiz.de/10011603959
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