Huang, S. Y.; Liang, J. J.; Hsu, S. Y.; Lin, L. K.; … - In: The European Physical Journal B - Condensed Matter and … 79 (2011) 2, pp. 153-162
A direct determination of the interfacial transparency on the basis of current-perpendicular-to-plane (CPP) resistances for Cu<Subscript>0.5</Subscript>Ni<Subscript>0.5</Subscript>/Nb layered system is presented. This particular realization has substantial significance for understanding the interfacial transport in such heterostructures....</subscript></subscript>