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~person:"Jaffe, Adam B."
~person:"Jeon, Haejun"
~type_genre:"Arbeitspapier"
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Jaffe, Adam B.
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Low-quality patents in the eye of the beholder : evidence from multiple examiners
De Rassenfosse, Gaétan
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Jaffe, Adam B.
;
Webster, Elizabeth
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2016
Persistent link: https://www.econbiz.de/10011490406
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