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~person:"Kim, Byunghoon"
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Kim, Byunghoon
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A generalised uncertain decision tree for defect classification of multiple wafer maps
Kim, Byunghoon
;
Jeong, Young-Seon
;
Tong, Seung Hoon
; …
- In:
International journal of production research
58
(
2020
)
9
,
pp. 2805-2821
Persistent link: https://www.econbiz.de/10012265272
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