LI, J. C.; LI, M.; JIANG, Q. - In: Surface Review and Letters (SRL) 15 (2008) 06, pp. 829-832
The critical thickness of structural transition from a tetragonal structure to a normal bulk structure for epitaxial ultrathin films deposited on the metallic and semiconductor substrates is thermodynamically considered. It is found that equilibrium between the elastic energy of the tetrahedral...