SU, WEI-TAO; LI, BIN; LIU, DING-QUAN; ZHANG, FENG-SHAN - In: Surface Review and Letters (SRL) 16 (2009) 03, pp. 449-453
Surface crack of CeF3 films generated by thermal stress were characterized by scanning electron microscopy and atom … surface elastic properties of CeF3 films can be easily qualitatively measured by low frequency AFAM. …