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~person:"Lee, J. H."
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Lee, J. H.
Lee, Jong-Ho
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Cycle time estimation for semiconductor final testing processes with Weibull-distributed weiting time
Tai, Y. T.
;
Pearn, Wen-lea
;
Lee, J. H.
- In:
International journal of production research
50
(
2012
)
2
,
pp. 581-592
Persistent link: https://www.econbiz.de/10009549619
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2
The measurement and sources of technological change biases, with an application to postwar Japanese agriculture
Lee, J. H.
- In:
Economica
50
(
1983
),
pp. 159-173
Persistent link: https://www.econbiz.de/10002464088
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