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Quality and reliability engineering international
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Feature extraction and classification models for high‐dimensional profile data
Shinde, Amit
;
Church, George
;
Janakiram, Mani
;
Runger, …
- In:
Quality and reliability engineering international
27
(
2011
)
7
,
pp. 885-894
Persistent link: https://www.econbiz.de/10009342108
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